DRAM Characterization under Relaxed Refresh Period Considering System Level Effects within a Commodity Server
Published in IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS), 2018
Recommended citation: Mukhanov, L., Tovletoglou, K., Nikolopoulos, D. S., & Karakonstantis, G. (2018). "DRAM Characterization under Relaxed Refresh Period Considering System Level Effects within a Commodity Server." In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), 236-239. https://doi.org/10.1109/IOLTS.2018.8474184
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